Plasma and Fusion Research

Volume 19, 1201021 (2024)

Rapid Communications


Determination of Parallel and Perpendicular Ion Temperatures Based on Selective Ion Transmission in a Retarding Field Analyzer
Shigetaka KAGAYA, Hiroyuki TAKAHASHI, Tomohiro SEINO, Keigo YOSHIMURA, Ryota NISHIMURA, Akihiro KANNO, Yusaku TAKAHASHI, Tomoya HARA, Tetsutarou OISHI, Akinobu MATSUYAMA1) and Kenji TOBITA
Department of Quantum Science and Energy Engineering, Tohoku University, Sendai 980-8579, Japan
1)
Graduate School of Energy Science, Kyoto University, Uji 606-8501, Japan
(Received 9 February 2024 / Accepted 3 April 2024 / Published 2 May 2024)

Abstract

This work reports a novel approach employing a retarding field analyzer (RFA) to simultaneously measure parallel and perpendicular ion temperatures. I-V curves obtained by the RFA were analyzed considering the influence of selective ion transmission, and the ion temperatures were evaluated. The RFA analysis yielded parallel and perpendicular ion temperatures of 1.2 eV and 2.1 eV, respectively. The perpendicular ion temperature obtained by an ion sensitive probe was 2.0 eV, demonstrating good agreement with that evaluated by the RFA.


Keywords

retarding field analyzer, selective ion transmission, ion temperature, radio-frequency plasma, DT-ALPHA

DOI: 10.1585/pfr.19.1201021


References

  • [1] T. Takizuka et al., J. Nucl. Mater. 128-129, 104 (1984).
  • [2] S. Togo et al., J. Nucl. Mater. 463, 502 (2015).
  • [3] A. Froese et al., Plasma Fusion Res. 5, 026 (2010).
  • [4] R.A. Pitts et al., Nucl. Fusion 46, 82 (2006).
  • [5] M. Kocan et al., Contrib. Plasma Phys. 50, 836 (2010).
  • [6] M. Henkel et al., Fusion Eng. Des. 157, 111623 (2020).
  • [7] R. Ochiai et al., Plasma Fusion Res. 15, 2401040 (2020).
  • [8] H. Takahashi et al., AIP Advances 10, 085018 (2020).
  • [9] H. Takahashi et al., Phys. Plasmas 30, 053506 (2023).
  • [10] A. Okamoto et al., Plasma Fusion Res. 3, 059 (2008).
  • [11] H. Takahashi et al., Phys. Plasmas 26, 022511 (2019).
  • [12] A.W. Molvik, Rev. Sci. Instrum. 52, 704 (1981).