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Coincident Measurement of a Weakly Backscattered X-ray with a CPA Laser-Produced X-ray Pulse

Hajime KUWABARA^1,2), Yoshitaka MORI¹⁾ and Yoneyoshi KITAGAWA¹⁾

1)

The Graduate School for the Creation of New Photonics Industries, Nishi-ku, Hamamatsu 431-1202, Japan

2)

IHI Corporation, Isogo-ku, Yokohama 235-8501, Japan

(Received 16 November 2007 / Accepted 30 November 2007 / Published 15 January 2008)

Abstract

Backscattered X-ray intensity was measured coincidently with a CPA laser-produced X-ray pulse. Results show that the coincident measurement is useful in reducing the effect of natural radiation. Even for signals at the photon counting level, we can distinguish the scattering materials and their thickness from the difference in backscattered X-ray counts. These results suggest that the backscattered X-ray can be used for imaging any distant object.

Copyright (c) 2008 The Japan Society of Plasma Science and Nuclear Fusion Research

Keywords

backscattered X-ray, coincident measurement, X-ray pulse, laser-produced X-ray, imaging

DOI: 10.1585/pfr.3.003

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References

• [1] R.W. Schoenlein et. al., Appl. Phys. B 71, 1 (2000).
• [2] J.D. Kmetec et. al., IEEE J. Quantum Elect. 10, 2832 (1992).
• [3] Y. Kitagawa et. al., IEICE Technical Report 90, 33 (2006).
• [4] V.O. Klein and Y. Nishina, Z. Phys. 52, 853 (1929).

This paper may be cited as follows:

Hajime KUWABARA, Yoshitaka MORI and Yoneyoshi KITAGAWA, Plasma Fusion Res. 3, 003 (2008).