Plasma and Fusion Research

Volume 13, 1406042 (2018)

Regular Articles

Repeatable Intense Beam Generation of Micro-Particles Attached with 107 Electrons
Akihiro MOHRI and Akio SANPEI1)
Res. Ins. Graduate School of Human and Environmental Studies, Kyoto University, Yoshida-nihonmatsu-cho, Sakyo-ku, Kyoto 606-8501, Japan
1)
Graduate School of Science Technology, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, Japan
(Received 8 March 2018 / Accepted 3 April 2018 / Published 10 May 2018)

Abstract

Intense beams of micro-particles, each attached with approximately 1.1 × 107 electrons, were generated repeatedly. The particle was a spherical divinyl benzene polymer of 10 μm diameter, coated with 450 Å thick gold. More than 5000 charged particles were extracted outside in 0.5 s using an assembly composed of a reservoir, a helicoid conveyer, an oscillating sawtoothed plate and a charging section of a high electric field.

Keywords

highly charged particle, pulsed beam source, particle injector

DOI: 10.1585/pfr.13.1406042

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References

  • [1] L. Boufendi, M.Ch. Jouanny, E. Kovacevie, J. Berndt and M. Milikian, J. Phys. D 44, 1 (2011).
  • [2] J.E. Allen, Phys. Scr. 45, 497 (1992).
  • [3] S.M. Collins, D.A. Brown, J.F. O'Hanlon and R.N. Carlile, J. Vac. Sci. Technol. A 14, 634 (1996).
  • [4] S.A. Khrapak, S.V. Ratynskaia, A.V. Zobnin, A.D. Usachev, V.V. Yaroshenko, M.H. Thoma, M. Kretschmer, H. Hofner, G.E. Morfill, O.F. Petrov and V.E. Fortov, Phys. Rev. E 72, 016406 (2005).
  • [5] S. Nunomura, N. Ohno and S. Takamura, Jpn. J. Appl. Phys. 36, L949 (1997).
  • [6] A.V. Ivlev, A.G. Khrapak, S.A. Khrapak, B.M. Annaratone, G. Morfill and K. Yoshino, Phys. Rev. E 68, 026403 (2003).
  • [7] B.M. Annaratone, A.G. Khrapak, A.V. Ivlev, G. Söllner, P. Bryant, R. Sütterlin, U. Konopka, K. Yoshino, M. Zuzic, H.M. Thomas and G.E. Morfill, Phys. Rev. E 63, 036406 (2001).
  • [8] A. Sanpei, T. Kigami, H. Kanaya, Y. Hayashi and M. Sampei, IEEE Trans. Plasma Sci. 46, 718 (2018).
  • [9] Y. Enokido, R. Ishigami, M. Kondo, J. Goto, K. Sekine and F. Fukuzawa, J. Nucl. Sci. Technol. 37, 750 (2000).
  • [10] F. Fukuzawa, Oyo Butsuri 60, 720 (1991) [in Japanese].
  • [11] H. Shelton, C.D. Hendricks Jr. and R.F. Wuerker, J. Appl. Phys. 31, 1243 (1960).
  • [12] J.F. Friichtenicht, Rev. Sci. Instrum. 33, 209 (1962).
  • [13] N. Ikawa, Y. Mori and T. Ide, Seimitu Kikai 43, 91 (1977) [in Japanese].