[Table of Contents]

Plasma and Fusion Research

Volume 2, S1084 (2007)

Regular Articles

Characteristic Observation of the Ion Beams in the Plasma Focus Device
H. R. YOUSEFI, Y. NAKATA, H. ITO and K. MASUGATA
Department of Electric and Electronic System Engineering, University of Toyama, Toyama 930-8555, Japan
(Received 4 December 2006 / Accepted 25 May 2007 / Published 20 November 2007)

Abstract

The proton emission from the plasma focus device with the H2 filling was analyzed. The ion beam characteristics, particle pinhole image and pinch plasma image were obtained with an aluminum filtered pinhole camera with CR-39 film and x-ray pinhole camera with Be filter respectively. Ring-shaped of ion bunches were observed and also on the pinched plasma column same shape was attributed.

Keywords

plasma focus, ion beam emission, pinch plasma

DOI: 10.1585/pfr.2.S1084

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This paper may be cited as follows:

H. R. YOUSEFI, Y. NAKATA, H. ITO and K. MASUGATA, Plasma Fusion Res. 2, S1084 (2007).