[Table of Contents]

Plasma and Fusion Research

Volume 2, S1067 (2007)

Regular Articles

Development of a High Resolution X-Ray Imaging Crystal Spectrometer for Measurement of Ion-Temperature and Rotation-Velocity Profiles in Fusion Energy Research Plasmas
K. W. HILL, M. L. BITTER, Ch. BROENNIMANN1), E. F. EIKENBERRY1), A. Ince-CUSHMAN2), S.G. LEE3), J.E. RICE2), S. SCOTT and R. BARNSLEY4)
Princeton University Plasma Physics Laboratory, Princeton, NJ, USA
1)
SLS, Paul Scherrer Institute, Villigen, Switzerland
2)
PSFC, MIT, Cambridge, MA, USA
3)
NFRC, Korea Basic Science Institute, Daejeon, Korea
4)
Queen's University Belfast and EFDA/JET
(Received 6 December 2006 / Accepted 13 April 2007 / Published 20 November 2007)

Abstract

A new imaging high resolution x-ray crystal spectrometer (XCS) has been developed to measure continuous profiles of ion temperature and rotation velocity in fusion plasmas. Following proof-of-principle tests on the Alcator C-Mod tokamak and the NSTX spherical tokamak, and successful testing of a new silicon, pixilated detector with 1 MHz count rate capability per pixel, an imaging XCS is being designed to measure full profiles of Ti and vφ on C-Mod. The imaging XCS design has also been adopted for ITER. Ion-temperature uncertainty and minimum measurable rotation velocity are calculated for the C-Mod spectrometer. The affects of x-ray and nuclear-radiation background on the measurement uncertainties are calculated to predict performance on ITER.

Keywords

ion-temperature, rotation velocity, diagnostic, x-ray, crystal spectrometer, detector, C-Mod, ITER

DOI: 10.1585/pfr.2.S1067

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References

  • [1] J.E. Rice et al., Rev. Sci. Instrum. 66, 752 (1995).
  • [2] M. Bitter et al., TFTR vertical XCS array paper.
  • [3] M. Bitter et al., Rev. Sci. Instrum. 75, 3660 (2004).
  • [4] Ch. Broennimann et al., J. Synchotron Radiation 13, 120 (2006).
  • [5] R. Barnsley et al., Rev. Sci. Instrum 75, 3743 (2004); and report from this conference.
  • [6] M. Bitter et al., presented at the 15th International Room Temperature Semiconductor Workshop, October 29-November 4, San Diego, CA.
  • [7] I.H. Hutchinson, “Statistical Uncertainty in Line Shift and Width Interpretation,” unpublished report.

This paper may be cited as follows:

K. W. HILL, M. L. BITTER, Ch. BROENNIMANN, E. F. EIKENBERRY, A. Ince-CUSHMAN, S.G. LEE, J.E. RICE, S. SCOTT and R. BARNSLEY, Plasma Fusion Res. 2, S1067 (2007).