Plasma and Fusion Research

Volume 17, 2405021 (2022)

Regular Articles

Simulation of Decay of Shielding Currents in ITER-TF Joint Samples
Shinsaku IMAGAWA1,2), Hideki KAJITANI3), Tetsuhiro OBANA1,2), Suguru TAKADA1,2), Shinji HAMAGUCHI1,2), Hirotaka CHIKARAISHI1), Yuta ONODERA1), Kazuya TAKAHATA1,2), Kunihiro MATSUI3) and Norikiyo KOIZUMI3)
National Institute for Fusion Science, NINS, Toki 509-5292, Japan
The Graduate University for Advanced Studies, SOKENDAI, Toki 509-5292, Japan
Fusion Energy Directorate, National Institutes for Quantum Science and Technology, Naka 311-0193, Japan
(Received 18 December 2021 / Accepted 17 February 2022 / Published 30 March 2022)


As a qualification test of ITER-TF coils, each joint sample was tested prior to manufacture of each TF coil. Eleven joint samples were tested by a conductor test facility with a 9 T split coil. The joint sample comprised two short TF conductors that had twin-box joint terminals at both ends. The lower joint is a testing part that is a full-size joint of the TF coil. Hall probes were attached on the lower joint box to measure the field induced by shielding currents. In order to simulate the shielding currents, an equivalent current circuit has been considered. The main loop of the shielding currents is the current flow in two conductors with crossing the jointed plane twice. The other two loops are the current loops inside superconducting cables in the two conductors. The resistance of the latter loops is given by twice the value of an average contact resistance between the superconducting strands. The calculated results are in good accordance with the experimental data, with an assumption that the overall joint resistance is decreased at low current. This phenomenon can be explained by the existence of a few strands contacting the joint box with extremely low joint resistances.


cable-in-conduit conductor, contact resistance, current dependence, joint resistance, Nb3Sn, shielding current, sintering, twin-box joint

DOI: 10.1585/pfr.17.2405021


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