Plasma and Fusion Research

Volume 15, 2402055 (2020)

Regular Articles

Measurement of Absolute Carbon Ion Density Profile Based on CXRS Diagnostic on HL-2A Tokamak
Liang LIU, Deliang YU, Xiaoxue HE, Yanling WEI, Dong LI, Qian MA1), Wenjin CHEN, Xiaofei HE, Neng ZHANG, Zengchen YANG, Yonggao LI, Longwen YAN, Zhongbing SHI, Yi LIU and Qingwei YANG
Southwestern Institute of Physics, Chengdu 610041, China
1)
Baoji University of Arts and Sciences, Baoji 721000, China
(Received 27 November 2019 / Accepted 12 June 2020 / Published 21 July 2020)

Abstract

The profile of absolute carbon ion density is calculated based on the charge exchange recombination spectroscopy (CXRS) diagnostic on HL-2A tokamak. The carbon ion concentration is derived by a combination of absolutely calibrated active spectrum intensity, neutral beam densities and effective charge exchange emission rates. The neutral beam densities for the full (Eb), one-half (Eb/2) and one-third (Eb/3) fractional beam energy components are calculated with the beam attenuation process which is determined by the beam stopping cross-section. The beam population of H∗(n = 2) to H(1 s) is evaluated, both of which contribute to the charge exchange procedure as donors. Zeff profiles measured by the local impurity concentration and visible bremsstrahlung are compared.

Keywords

carbon ion density profile, neutral beam attenuation, CXRS diagnostic

DOI: 10.1585/pfr.15.2402055

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