Plasma and Fusion Research
Volume 3, 003 (2008)
Rapid Communications
- 1)
- The Graduate School for the Creation of New Photonics Industries, Nishi-ku, Hamamatsu 431-1202, Japan
- 2)
- IHI Corporation, Isogo-ku, Yokohama 235-8501, Japan
Abstract
Backscattered X-ray intensity was measured coincidently with a CPA laser-produced X-ray pulse. Results show that the coincident measurement is useful in reducing the effect of natural radiation. Even for signals at the photon counting level, we can distinguish the scattering materials and their thickness from the difference in backscattered X-ray counts. These results suggest that the backscattered X-ray can be used for imaging any distant object.
Keywords
backscattered X-ray, coincident measurement, X-ray pulse, laser-produced X-ray, imaging
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This paper may be cited as follows:
Hajime KUWABARA, Yoshitaka MORI and Yoneyoshi KITAGAWA, Plasma Fusion Res. 3, 003 (2008).